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KMID : 1159320030050010079
Korean Journal of Vision Science
2003 Volume.5 No. 1 p.79 ~ p.86
Dioptric Power Measurement That Use Photo-Reflection Pattern
Kim Yong-Geun

Abstract
KEYWORD
Photo-reflection pattern, Dioptric power, Paraller-ray method
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ÇмúÁøÈïÀç´Ü(KCI)